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Imaging Magnetic Contrast in the (S)TEM
This session is part of the "Beyond the Scope: CEMAS Discussion Series."

Direct and local imaging of magnetic structure, domains, and spin textures in materials is essential to define their potential to be used in the next generation of electronic devices. Magnetic contrast imaging techniques in the (scanning) transmission electron microscope, (S)TEM, allow visualization of local magnetic properties and performance of in-situ experiments via applying magnetic fields. This seminar will introduce some of (S)TEM-based magnetic contrast imaging techniques, focusing on Lorentz electron microscopy techniques, and discuss their advantages, limitations, and applications.

Jul 8, 2020 02:30 PM in Eastern Time (US and Canada)

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